Kosaka S | Energy Technology Research Institute Aist Tsukuba Central
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概要
関連著者
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Kosaka S
Energy Technology Research Institute Aist Tsukuba Central
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Hayakawa H
Nagoya Univ. Nagoya Jpn
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KOSAKA Shin
Electrotechnical Laboratory
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HAYAKAWA Hisao
Electrotechnical Laboratory
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SHINOKI Fujitoshi
Electrotechinical Laboratory
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Shinoki F
Aomori Advanced Industrial Technol. Center Aomori Jpn
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Shoji A
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Takada S
Saitama Univ. Urawa‐shi Jpn
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Shoji Akira
Electrotechnical Laboratory
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Takada Susumu
Electrotechnical Laboratory
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Aoyagi Minoru
Electronics Engineering Group Nissan Motor Co. Ltd
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Nakagawa Hiroshi
Graduate School Of Materials Science Nara Institute Of Science And Technology
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NAKAGAWA Hiroshi
Electrotechical Laboratory (ETL)
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AOYAGI Masahiro
Electrotechical Laboratory (ETL)
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Takada S
Saitama University Faculty Of Engineering
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KOYANAGI Masao
Electrotechnical Laboratory
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Yamasaki Hirofumi
Energy Technology Research Institute Aist Tsukuba Central
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Obara Haruhiko
Energy Technology Research Institute Aist Tsukuba Central
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Obara Haruhiko
Energy Electronics Institute National Institute Of Advanced Industrial Science And Technology (aist)
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Koyanagi Masao
Electrote Chnicallaboratory
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NAKANISHI Masakazu
Electrotechnical Laboratory, National Institute of Advanced Industrial Science and Technology
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Nakagawa H
Univ. Tokyo Tokyo Jpn
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Mariappan Murugesan
Energy Technology Research Institute Aist Tsukuba Central
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KOSAKA Shin
Energy Technology Research Institute, AIST, Tsukuba Central
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Sogawa Eiichi
Electrotechnical Laboratory
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Nakanishi Masakazu
Electrotechnical Laboratory
著作論文
- Microwave Surface Resistance in 123 superconducting Thin Films
- Integrated DC-SQUID Magnetometer
- All Niobium Nitride Josephson Junction with Hydrogenated Amorphous Silicon Barrier and its Application to the Logic Circuit
- Operating Characteristics of Josephson Four-Junction Logic (4JL) Gate
- Josephson Tunnel Junctions with Nb, NbN Double-Layered Electrodes
- Tunneling Characteristics of NbN/NbN Josephson Junctions with Glow-Discharge-Produced Amorphous Silicon Barriers
- Current Injection Logic Gate with Four Josephson Junctions : C-2: JOSEPHSON DEVICES
- Fabrication of High Quality NbN/Pb Josephson Junction : C-2: JOSEPHSON DEVICES