Pis Igor | National Institute For Materials Science (nims)
スポンサーリンク
概要
関連著者
-
Kobata Masaaki
National Institute For Materials Science (nims)
-
Pis Igor
National Institute For Materials Science (nims)
-
Kobayashi Keisuke
National Institute For Materials Science (nims)
-
Daimon Hiroshi
Graduate School Of Material Science Nara Advanced Institute Of Science And Technology
-
IWAI Hideo
National Institute for Materials Science
-
PIS Igor
National Institute for Materials Science
-
KOBATA Masaaki
National Institute for Materials Science (NIMS), SPring-8
-
KOBAYASHI Keisuke
National Institute for Materials Science (NIMS), SPring-8
-
MATSUSHITA Tomohiro
Japan Synchrotron Radiation Research Institute
-
NOHIRA Hiroshi
Department of Electrical and Electronic Engineering, Musashi Institute of Technology
-
Nohira Hiroshi
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
-
SUZUKI Mineharu
ULVAC-PHI, Inc.
-
MATSUDA Hiroyuki
Graduate School of Environment and Information Sciences, Yokohama National University
-
Kobayashi Keisuke
National Inst. For Materials Sci. (nims)
-
Iwai Hideo
National Institute For Materials Science (nims)
-
YAMAZUI Hiromichi
ULVAC-PHI, Inc.
-
TAKAHASHI Hiroaki
ULVAC-PHI, Inc.
-
Daimon Hiroshi
Graduate School Of Materials Science Nara Institute Of Science And Technology (naist)
-
Nohira Hiroshi
Department Of Electrical And Electronic Engineering Tokyo City University
-
PIS Igor
Charles University, Faculty of Mathematics and Physics, Department of Surface and Plasma Science
-
KOBATA Masaaki
Beamline Station at SPring-8, National Institute for Materials Science (NIMS)
-
KOBAYASHI Keisuke
Beamline Station at SPring-8, National Institute for Materials Science (NIMS)
-
Suzuki Mineharu
Ulvac-phi Inc.
-
Matsushita Tomohiro
Japan Synchrotron Radiation Research Institute (jasri) Spring-8
-
Yamazui Hiromichi
Ulvac-phi Inc.
-
Takahashi Hiroaki
Ulvac-phi Inc.
-
Matsuda Hiroyuki
Graduate School Of Materials Science Nara Institute Of Science And Technology (naist)
著作論文
- Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
- Hard-X-ray Photoelectron Diffraction from Si(001) Covered by a 0-7-nm-Thick SiO_2 Layer