Otsuka T | Shin‐etsu Handotai Co. Ltd. Gunma Jpn
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概要
Shin‐etsu Handotai Co. Ltd. Gunma Jpn | 論文
- Study of Applicability of AC Photovoltaic Method and Photoconductive Decay Method Using Microwaves as Noncontact Methods for Bulk Lifetime Measurement
- Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects
- Medium Field Breakdown Following Local Tunneling Current on MOS Capacitor Containing Grown-in CZ Crystal Defects
- Position-Dependent Instability of Lithium-Drifted Silicon Detector
- Development of Lithium-Drifted Silicon Detectors Using an Automatic Lithium-Ion Drift Apparatus