Kasai N | National Inst. Of Advanced Industrial Sci. And Technol. Tsukuba‐shi Jpn
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概要
- KASAI Naokiの詳細を見る
- 同名の論文著者
- National Inst. Of Advanced Industrial Sci. And Technol. Tsukuba‐shi Jpnの論文著者
関連著者
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Kasai N
National Inst. Of Advanced Industrial Sci. And Technol. Tsukuba‐shi Jpn
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Yamamoto K
Mitsubishi Electric Corporation Information Technology R&d Center
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Okazaki Atsuo
Lcd Division Toshiba Corp.
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KASAI Naruhiko
Hitachi, Ltd., Systems Development Laboratory
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FUTAMI Toshio
Hitachi, Ltd., Displays
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Mamiya Johji
Ibm Japan Ltd. Display Business Unit
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Futami Toshio
Hitachi Ltd. Displays
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YAMAMOTO Ichiro
ULSI Device Development Laboratory, NEC Corporation
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Hanari Jun
Lcd Division Toshiba Corp.
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Koyama Kuniaki
Ulsi Device Development Laboratories Nec Corporation
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MAMIYA Johji
IBM Japan, Ltd., Display Business Unit
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YAMAUCHI Kazushi
IBM Japan, Ltd., Display Business Unit
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Mamiya Johji
IBM Display Business Unlt
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Yamauchi Kazushi
IBM Display Business Unlt
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Tomooka Takatoshi
IBM Display Business Unlt
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Ohara Moriyoshi
IBM Tokyo Research Laboratory
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Horino Shinji
Sharp Co., Ltd., LCD System Device Development Center
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Inoue Akihiko
Sharp Co., Ltd., LCD System Device Development Center
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Sato Yuji
Sharp Co., Ltd., LCD System Device Development Center
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Okazaki Atsurou
Toshiba LCD Division
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Horino Shinji
Sharp Co. Ltd. Lcd System Device Development Center
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Kasai Naoki
Ulsi Device Development Division Nec Electron Devices:(present Address)semiconductor Leading Edge Te
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Inoue Akihiko
Sharp Co. Ltd. Lcd System Device Development Center
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URABE Koji
ULSI Device Development Laboratories, NEC Corporation
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Urabe K
Ulsi Device Development Laboratories Nec Corporation
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Yamamoto I
Ulsi Device Development Laboratories Nec Corporation
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Yamamoto Ichiro
Ulsi Device Development Laboratories Nec Corporation
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Sato Yuji
Sharp Co. Ltd. Lcd System Device Development Center
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KOYAMA Kuniaki
ULSI Device Development Laboratories, NEC Corporation
著作論文
- Digital Packet Video Link for Super High Resolution Display(Special Issue on Electronic Displays)
- 6.1:Invited Paper:Digital PV Link for a Next-Generation Video Interface, and Its System Architecture(Attendance report of SID 2000 Symposium)
- Effects of Field Edge Steps on Electrical Gate Linewidth Measurements (Special Issue on Microelectronic Test Structure)