Iwasaki K | Faculty Of Engineering Chiba University
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概要
Faculty Of Engineering Chiba University | 論文
- Scan Design for Two-Pattern Test without Extra Latches(Dependable Computing)
- Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation(Dependable Computing)
- Proposal of Testable Multi-Context FPGA Architecture(Dependable Computing)
- Redundant Design for Wallace Multiplier(Dependable Computing)
- Evidence of Anisotropic Diffusion of Indium Atoms on a Surface of Perylene-3,4,9,10-tetracarboxilic dianhydride/MoS_2 System Observed by Photoelectron Emission Microscopy (PEEM)