Yaguchi T | Hitachi Instruments Engineering Co. Ltd. Ibaraki Jpn
スポンサーリンク
概要
関連著者
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Kamino Takeo
Naka Application Center Hitachi High-technologies Corporation
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YAGUCHI Toshie
Hitachi High Technologies Corp.
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KATO Takeharu
Japan Fine Ceramics Center
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Kamino T
Naka Application Center Hitachi High-technologies Corporation
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Yaguchi T
Hitachi Instruments Engineering Co. Ltd. Ibaraki Jpn
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KAMINO Takeo
Hitachi High Technologies Corp.
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Ishitani T
Semiconductor Energy Lab. Co. Ltd. Kanagawa Jpn
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Ishitani T
Central Research Laboratory Hitachi Ltd
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OHNISHI Tsuyoshi
Naka Division, Hitachi High-Technologies Corporation
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Ohnishi Tsuyoshi
Naka Division Hitachi High-technologies Corporation
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KONNO Mitsuru
Hitachi High Technologies Corp.
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OHNISHI Tsuyoshi
Hitachi High-Technologies Corp.
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ISHITANI Tohru
Hitachi High-Technologies Corp.
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Kuroda Yasushi
Hitachi Science Systems Ltd.
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ISHITANI Tohru
Naka Division, Hitachi High-Technologies Corporation
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WATABE Akira
Hitachi High Technologies Corp.
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NAGAKUBO Yasuhira
Hitachi Hi-Tech Science Systems Co. Ltd
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HASHIMOTO Takahito
Hitachi High-Technologies Corporation
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Horita Zenji
Dept. Of Materials Science And Engineering Faculty Of Engineering Kyushu University
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MIYAHARA Yuichi
Dept. of Materials Science and Engineering, Faculty of Engineering, Kyushu University
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Miyahara Yuichi
Dept. Of Materials Science And Engineering Faculty Of Engineering Kyushu University
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OSUMI Masako
Institute of Medical Mycology, Teikyo University
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UMEMURA Kaoru
Naka Division, Hitachi High-Technologies Corporation
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YAGUCHI Toshie
Naka Customer Center, Hitachi Science Systems, Ltd
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Umemura Kaoru
Naka Division Hitachi High-technologies Corporation
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Osumi Masako
Institute Of Medical Mycology Teikyo University
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Ishitani Tohru
Naka Division Hitachi High-technologies Corporation
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Ishitani Tohru
Naka Division Design And Manufacturing Group Hitachi High-technologies Corporation
著作論文
- Development of a specimen heating holder with an evaporator and gas injector and its application for catalyst
- In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles
- A method for multidirectional TEM observation of a specific site at atomic resolution
- Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV
- Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction