OHNISHI Tsuyoshi | Hitachi High-Technologies Corp.
スポンサーリンク
概要
関連著者
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Kamino Takeo
Naka Application Center Hitachi High-technologies Corporation
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KAMINO Takeo
Hitachi High Technologies Corp.
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YAGUCHI Toshie
Hitachi High Technologies Corp.
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KATO Takeharu
Japan Fine Ceramics Center
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OHNISHI Tsuyoshi
Hitachi High-Technologies Corp.
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ISHITANI Tohru
Hitachi High-Technologies Corp.
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Kamino T
Naka Application Center Hitachi High-technologies Corporation
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Ishitani T
Semiconductor Energy Lab. Co. Ltd. Kanagawa Jpn
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Ishitani T
Central Research Laboratory Hitachi Ltd
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Yaguchi T
Hitachi Instruments Engineering Co. Ltd. Ibaraki Jpn
著作論文
- A method for multidirectional TEM observation of a specific site at atomic resolution
- Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV
- Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell