Shih P‐s | National Chiao Tung Univ. Hsinchu Twn
スポンサーリンク
概要
関連著者
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Chang Chun
Department Of Electronics Engineering National Chiao Tung University
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Instiute Of Electronics National Chiao-tang University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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SHIH Po-Sheng
Institute of Electronics, National Chiao Tung University
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HUANG Tiao-Yuan
Institute of Electronics, National Chiao Tung University
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HUANG Tiao-Yuan
National Nano Device Laboratory
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
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CHANG Ting-Chang
National Nano Device Laboratories
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Chang T‐c
Department Of Physics National Sun Yat-sen University
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Shih P‐s
National Chiao Tung Univ. Hsinchu Twn
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Shih Po-sheng
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tang University:national Nano-device Laboratories
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Chang T‐c
National Nano Device Laboratories:department Of Physics National Sun Yat-sen University
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Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
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Zan H‐w
National Chiao Tung Univ. Hsinchu Twn
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Zan Hsiao-wen
Institute Of Electronics National Chiao Tung University
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YEH Ching-Fa
Institute of Electronics, National Chiao-Tung University
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SHIN Po-Sheng
Institute of Electronics, National Chiao Tung University
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Yeh Ching-fa
Institute Of Electronics National Chiao Tang University
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Shin Po-sheng
Institute Of Electronics National Chiao Tung University
著作論文
- Characterization and Reliability of Lightly-Doped-Drain Polysilicon Thin-Film Transistors with Oxide Sidewall Spacer Formed by One-Step Selective Liquid Phase Deposition
- Dimensional Effects on the Drain Current of N-and P-Channel Polycrystalline Silicon Thin Film Transistors