Stecker Lisa | Sharp Laboratories Of America Inc.

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概要

• STECKER Lisaの詳細を見る
• 同名の論文著者
• Sharp Laboratories Of America Inc.の論文著者

関連著者

• Ulrich Bruce

  Sharp Laboratories Of America Inc.

• HSU Sheng

  Sharp Laboratories of America, Inc.

• Stecker Lisa

  Sharp Laboratories Of America Inc.

• Evans David

  Sharp Laboratories Of America Inc.

• Evans D

  Sharp Laboratories Of America Inc.

• Hsu S

  Sharp Lab. America Inc. Wa Usa

• STECKER Lisa

  Sharp Laboratories of America, Inc.

• EVANS Dave

  Sharp Laboratories of America, Inc.

• Li Tingkai

  Sharp Laboratories Of America Inc.

• Hsu Sheng

  Sharp Microelectronics Laboratory

• LI Tingkai

  Sharp Laboratories of America, Inc.

• ZHANG Fengyan

  Sharp Laboratories of America, Inc.

• ONO Yoshi

  Sharp Laboratories of America, Inc.

• ZHUANG Weiwei

  Sharp Laboratories of America, Inc.

• YING Hong

  Sharp Laboratories of America, Inc.

• MAA Jershen

  Sharp Laboratories of America, Inc.

• Ono Y

  Fuji Xerox Co. Ltd. Kanagawa Jpn

• Ying Hong

  Sharp Laboratories Of America Inc.

• Maa Jershen

  Sharp Laboratories Of America Inc.

• Zhuang Weiwei

  Sharp Laboratories Of America Inc.

• Zhang Fengyan

  Sharp Laboratories Of America Inc.

• Hsu Sheng

  Sharp Laboratories of America, Inc., 5700 NW Pacific Rim Blvd. Camas, WA 98607, U.S.A.

• Li Tingkai

  Sharp Laboratories of America, Inc., 5700 NW Pacific Rim Blvd. Camas, WA 98607, U.S.A.

• Stecker Lisa

  Sharp Laboratories of America, Inc., 5700 NW Pacific Rim Blvd. Camas, WA 98607, U.S.A.

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著作論文

• One Transistor Ferroelectric Memory Devices with Improved Retention Characteristics
• Fabrication and Characterization of Sub-Micron Metal-Ferroelectric-Insulator-Semiconductor Field Effect Transistors withPt/Pb_5Ge_3O_/ZrO_2/Si Structure : Surfaces, Interfaces, and Films
• One Transistor Ferroelectric Memory Devices with Improved Retention Characteristics

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