Shi Jen-bin | Department Of Electronic Engineering Feng-chia University
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概要
Department Of Electronic Engineering Feng-chia University | 論文
- Alternative Method of Wavelength Drift Free Dual-Wavelength Heterodyne Interferometry for the Absolute Distance Measurement
- Impacts of Cu/TaN Electrode on the Electrical Properties of Metal-insulator-metal (Ba,Sr)TiO_3 Thin-film Capacitors
- Improving Characteristics of Tantalum Oxide Thin Film Devices with Copper Electrodes
- High performance bottom-gated poly-Si thin film transistors employing novel extended metal-pad (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- High performance bottom-gated poly-Si thin film transistors employing novel extended metal-pad (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))