Hobo Kenji | Research And Development Lab. Daido Steel Co. Ltd.
スポンサーリンク
概要
関連著者
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Hobo Kenji
Research And Development Lab. Daido Steel Co. Ltd.
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Sone Hidetoshi
Research And Development Lab. Daido Steel Co. Ltd.
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Hirotani Masumi
Research And Development Lab. Daido Steel Co. Ltd.
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Kato Toshihiro
Research & Development Laboratory, Daido Steel Co., Ltd., 2-30 Daido-cho, Minami-ku, Nagoya 457-8545, Japan
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Saka Takashi
Department of Applied Electronics, Daido Institute of Technology, 2-21 Daido-cho, Minami-ku, Nagoya 457-8531, Japan
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SAKA Takashi
Department of Applied Electronics, Daido Institute of Technology
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SAKA Takashi
Department of Electrical and Electronic Engineering, Daido Institute of Technology
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Kato Toshihiro
Research and Development Lab., Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Kato Toshihiro
Research and Development Laboratory, Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Sone Hidetoshi
Research and Development Lab., Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Sone Hidetoshi
Research and Development Laboratory, Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Saka Takashi
Department of Electrical Engineering and Electronics, Daido Institute of Technology, 10-3 Takiharu-cho, Minami, Nagoya 457-8530, Japan
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Saka Takashi
Department of Electrical and Electronic Engineering, School of Engineering, Daido University, 10-3 Takiharu-cho, Minami, Nagoya 457-8530, Japan
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Hirotani Masumi
Research and Development Lab., Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Hirotani Masumi
Research and Development Laboratory, Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Aikawa Moritaka
Research and Development Laboratory, Daido Steel Co., Ltd., 2-30 Daido-cho, Minami, Nagoya 457-8545, Japan
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Harada Haruyuki
Department of Electrical and Electronic Engineering, School of Engineering, Daido University, 10-3 Takiharu-cho, Minami, Nagoya 457-8530, Japan
著作論文
- Development of Highly Reliable Point Source Infrared Light-Emitting Diodes and Analysis Using a New Parameter of Dark Area Ratio
- Evidence of Correlation between Dark Spots and Dislocations Originating from Substrate in Light-Emitting Diodes