Lee S. | School Of Electrical Engineering Kookmin University
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概要
関連著者
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Lee S.
School Of Electrical Engineering Kookmin University
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Lee S.
School of Advanced Materials Engineering, Chonbuk National University, Chonju-si, Chonbuk 561-756, Korea
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LEE J.
School of Elec. Eng. and Computer Science, Kyungpook National Univ.
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KIM D.
School of Elec. Eng. and Computer Science, Kyungpook National Univ.
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Kim K.
School Of Mechanical Engineering Pusan National University
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Lee J.
School Of Advanced Materials Science And Engineering And Skku Advanced Institute Of Nanotechnology S
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Lee S.
School Of Life Sciences And Biotechnology Korea University
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Min K.
School Of Electrical Engineering Kookmin University
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Lee J.
School Of Electrical Engineering Kookmin University
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Kim D.
School Of Elec. Eng. And Computer Science Kyungpook National Univ.
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Kim D.
School Of Electrical Engineering Kookmin University
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Seo S.
School Of Physics And Research Center For Oxide Electronics Seoul National University
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Lee C.
School of Agricultural Biotechnology
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Roh K.
School of Electrical Engineering, Kookmin University
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Kang G.
School of Electrical Engineering, Kookmin University
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Choi C.
School of Electrical Engineering, Kookmin University
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Song K.
School of Electrical Engineering, Kookmin University
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Park S.
School of Electrical Engineering, Kookmin University
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Jeon K.
School of Electrical Engineering, Kookmin University
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Park J.
School of Electrical Engineering, Kookmin University
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Kim K.
School Of Electrical Engineering Kookmin University
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Roh K.
School Of Electrical Engineering Kookmin University
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Park S.
School Of Electrical Engineering Kookmin University
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Lee C.
School Of Electrical Engineering Kookmin University
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Kim K.
School Of Electrical Engineering And Computer Science Kyungpook National University
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Jeon K.
School Of Electrical Engineering Kookmin University
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Park J.
School Of Electrical Engineering Kookmin University
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Seo S.
School Of Electrical Engineering Kookmin University
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Kang G.
School Of Electrical Engineering Kookmin University
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Song K.
School Of Electrical Engineering Kookmin University
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Choi C.
School Of Electrical Engineering Kookmin University
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Song K.
School of Architectural Engineering, Hangyang University, Korea:Department of Architecture, Inha Technical College, Korea
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Park J.
School of Architectural Engineering, Hangyang University, Korea:Department of Architecture, Inha Technical College, Korea
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Lee K.
Sbu Development Center Boe_tft_lcd_sbu
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Kim H.
Sbu Development Center Boe_tft_lcd_sbu
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KIM M.
SBU Development Center, BOE_TFT_LCD_SBU
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Kim S.
Sbu Development Center Boe_tft_lcd_sbu
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Lim Y.
Sbu Development Center Boe_tft_lcd_sbu
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Seen S.
Sbu Development Center Boe_tft_lcd_sbu
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Jung Y.
Sbu Development Center Boe_tft_lcd_sbu
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Lee S.
School Of Electrical Engineering Seoul National University
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Seo J.
School Of Electrical Engineering Seoul National University
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Jung H.
School of Electrical Engineering, Seoul National University
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Lee K.
SBU Development Center, BOE_TFT_LCD_SBU, San 136-1, Ami-ri, Bubal-eup, Ichon-si, Kyungki-do 467-701, Korea
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Kim S.
SBU Development Center, BOE_TFT_LCD_SBU, San 136-1, Ami-ri, Bubal-eup, Ichon-si, Kyungki-do 467-701, Korea
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Kim M.
SBU Development Center, BOE_TFT_LCD_SBU, San 136-1, Ami-ri, Bubal-eup, Ichon-si, Kyungki-do 467-701, Korea
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Seen S.
SBU Development Center, BOE_TFT_LCD_SBU, San 136-1, Ami-ri, Bubal-eup, Ichon-si, Kyungki-do 467-701, Korea
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Kim H.
SBU Development Center, BOE_TFT_LCD_SBU, San 136-1, Ami-ri, Bubal-eup, Ichon-si, Kyungki-do 467-701, Korea
著作論文
- Iron Loss Analysis of Interior Permanent Magnet Synchronous Machine Considering Driving Condition(Asia-Pacific Symposium on Applied Electromagnetics and Mechanics (APSAEM08))
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Dynamic Stability of Liquid Crystal Depending on Shape of Pixel Edge in the Fringe Field Switching Mode