NAGASAWA Hiroyuki | Materials Research laboratory, HOYA Corporation
スポンサーリンク
概要
関連著者
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NAGASAWA Hiroyuki
Materials Research laboratory, HOYA Corporation
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YAMAGUCHI Yoh-ichi
Materials Research laboratory, HOYA Corporation
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Yamaguchi Yoh-ichi
Materials Research Laboratory Hoya Corporation
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Nagasawa Hiroyuki
Materials Research Laboratory Hoya Corporation
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Yamaguchi Y
Core Technology Laboratory Mitsui Kinzoku
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Sugawara M
Fujitsu Laboratories Ltd.
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Yamaguchi Y
Fuji Xerox Co. Ltd. Kanagawa Jpn
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YAMASHIRO Kazuhide
Materials Research laboratory, HOYA Corporation
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SUGAWARA Minoru
Materials Research laboratory, HOYA Corporation
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Sugawara M
Semiconductor Company Sony Corporation
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Sugawara M
Fujitsu Limited And Fujitsu Laboratories Limited
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Yamashiro Kazuhide
Materials Research Laboratory Hoya Corporation
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Nagasawa H
Osaka Prefecture Univ. Osaka Jpn
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Shoki Tsutomu
Materials Research Laboratory Hoya Corporation
著作論文
- Smoothing Roughness of SiC Membrane Surface for X-Ray Masks : X-Ray Lithography
- Smoothing Roughness of SiC Membrane Surface for X-Ray Masks
- Effect of Anodic Bonding Temperature on Mechanical Distortion of SiC X-Ray Mask Substrate