He Ping | Institute Of Microelectronics Tsinghua University
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概要
関連著者
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He Ping
Institute Of Microelectronics Tsinghua University
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CHEN Jing
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy o
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CHEN Meng
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy o
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WANG Xi
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy o
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Chen J
Ion Beam Laboratory Shanghai Institute Of Microsystem And Information Technology Chinese Academy Of
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DONG Yemin
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy o
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TIAN Lilin
Institute of Microelectronics, Tsinghua University
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LIU Litian
Institute of Microelectronics, Tsinghua University
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LI Zhijian
Institute of Microelectronics, Tsinghua University
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Tian Lilin
Institute Of Microelectronics Tsinghua University
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Liu Litian
Institute Of Microelectronics Tsinghua University
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Li Zhijian
Institute Of Microelectronics Tsinghua University
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Dong Yemin
Ion Beam Laboratory Shanghai Institute Of Microsystem And Information Technology Chinese Academy Of
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He Ping
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Wang Xi
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China
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Chen Meng
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China
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Chen Jing
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China
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Liu Litian
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Tian Lilin
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Li Zhijian
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Dong Yemin
Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China
著作論文
- Synthesis and Thermal Conductivity Measurement of High-Integrity Ultrathin Oxygen-Implanted Buried Oxide Layers
- Synthesis and Thermal Conductivity Measurement of High-Integrity Ultrathin Oxygen-Implanted Buried Oxide Layers