Dai B‐t | National Nano Device Laboratories
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概要
National Nano Device Laboratories | 論文
- Mechanism and Modeling of Ring Pattern Formation for Electron Beam Exposure on Zwitterresist
- Mechanism and Modeling of Ring Pattern Formation for Electron Beam Exposure on Zwitterresist
- A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millim
- Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors
- Characterization of RF LDMOS Transistors with Different Layout Structures