YOON M. | Seoul Branch, Korea Basic Science Institute
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概要
関連著者
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Park Sung
Samsung Advanced Institute Of Technology
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YOON M.
Seoul Branch, Korea Basic Science Institute
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CHOI H.
Seoul Branch, Korea Basic Science Institute
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Park Il-woo
Seoul Branch Korea Basic Science Institute
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PARK Il-Woo
Seoul Branch, Korea Basic Science Institute
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KOH Eui
Seoul Branch, Korea Basic Science Institute
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Koh Eui
Seoul Branch Korea Basic Science Institute
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Park Il-Woo
Seoul Branch, Korea Basic Science Institute, Seoul 136-701, Korea
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Park Sung
Samsung Advanced Institute of Technology, P.O. Box 111, Suwon 440-600, Korea
著作論文
- Free Carrier Concentration Gradient along the c-Axis of a Freestanding Si-doped GaN Single Crystal
- Free Carrier Concentration Gradient along the $c$-Axis of a Freestanding Si-doped GaN Single Crystal