Mihara Takashi | Applied Research Dept., Corporate Research Division, Olympus Optical Corp., Ltd.
スポンサーリンク
概要
関連著者
-
WATANABE Hideyuki
Diamond Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
-
Watanabe Hirohito
Institute Of Material Science University Of Tsukuba
-
Watanabe H
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
-
Watanabe H
Semiconductor Leading Edge Technol. Inc. Yokohama Jpn
-
Mihara Takashi
Applied Research Dept., Corporate Research Division, Olympus Optical Corp., Ltd.
-
Watanabe Hitoshi
Applied Research Dept., Corporate Research Division, Olympus Optical Corp., Ltd.
-
WATANABE Hajime
ULSI Laboratory, Mitsubishi Electric Corporation
-
Mihara T
National Institute Of Advanced Industrial Science And Technology
-
Mihara Takashi
Applied Research Department Corporate Research Division Olympus Optical Co. Ltd.
-
Watanabe Hideo
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
-
Watanabe Hitoshi
Applied Research Department Corporate Research Division Olympus Optical Co. Ltd.
-
Paz De
University Of Colorado At Colorado Springs And Symetrix Corporation
-
Yoshimori Hiroyuki
Applied Research Dept., Corporate Research Division, Olympus Optical Corp., Ltd.
-
Yoshimori Hiroyuki
Applied Research Dept. Corporate Research Division Olympus Optical Corp. Ltd.
-
Araujo Carlos
University Of Colorado At Colorado Springs And Symetrix Corporation
著作論文
- Depolarization Characteristics in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Origin of Depolarization in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Characteristic Change Due to Polarization Fatigue of Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Polarization Fatigue Characteristics of Sol-Get Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Evaluation of Imprint Properties in Sol-Get Ferroelectric Pb(ZrTi)O_3 Thin-Film Capacitors