HOMMA Yoshikazu | Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratories
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概要
- 同名の論文著者
- Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratoriesの論文著者
関連著者
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SUZUKI Mineharu
Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratories
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HOMMA Yoshikazu
Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratories
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Suzuki Mineharu
Center For Analytical Technology And Characterization Ntt Interdisciplinary Research Laboratories
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Homma Yoshikazu
Center For Analytical Technology And Characterization Ntt Interdisciplinary Research Laboratories
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HIBINO Hiroki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Hibino H
Ntt Basic Res. Lab. Kanagawa Jpn
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Hibino Hiroki
Ntt Basic Research Laboratories
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MIKI Kazushi
Research Center for Advanced Carbon Materials and Nanotechnology Research Institute National Institu
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MIKI Kazushi
Nanotechnology Research Institute-AIST
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SATO Tomoshige
JEOL Ltd.
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IWATSUKI Masashi
JEOL Ltd.
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TOKUMOTO Hiroshi
Electrotechmical Laboratory
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MIKI Kazushi
Electrotechnical Laboratory (ETL)
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FUKUDA Tsuneo
NTT Basic Research Laboratories
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Yabumoto N
Ntt Interdisciplinary Lab. Musashino Jpn
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Yabumoto Norikuni
Ntt Interdisciplinary Research Laboratories Ntt Advanced Technology Corporation
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Miki K
Electrotechnical Laboratory (etl)
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Miki Kazushi
National Institute Of Materials Science (nims)
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Miki Kazushi
Aist
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Miki Kazushi
Nanoarchitecture Group Organic Nanomaterials Center National Institute For Materials Science
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Miki Kazushi
Electrotechnical Laboratory
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KUDOH Yukie
Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratories
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YABUMOTO Norikuni
Center for Analytical Technology and Characterization, NTT Interdisciplinary Research Laboratories
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Kudoh Yukie
Hitachi Electronics Engineering Co. Ltd.
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Iwatsuki Masashi
Jeol Ltd
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Tokumoto Hiroshi
Electrotechincal Laboratory
著作論文
- Real-Time Observation of (1×1)-(7×7) Phase Transition on Vicinal Si(111) Surfaces by Scanning Tunneling Microscopy
- Roughness Evaluation of Thermally Oxidized Si(111) Surfaces by Scanning Force Microscopy