SEKIGUCHI Yoichi | Optical Measurement Technology Development Co., Ltd.

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概要

• 同名の論文著者
• Optical Measurement Technology Development Co., Ltd.の論文著者

関連著者

• Wada Morio

  Optical Measurement Technology Development Co. Ltd.

• SAKAKIBARA Katsutoshi

  Optical Measurement Technology Development Co., Ltd.

• SEKIGUCHI Yoichi

  Optical Measurement Technology Development Co., Ltd.

• Wada M

  Miyanodai Technology Development Center Fuji Photo Film Co. Ltd.

• Sakakibara Katsutoshi

  Optical Measurement Technology Development Co. Ltd.

• Sekiguchi Y

  Canon Inc. Tokyo Jpn

• Sakakibara K

  Department Of Applied Physics Graduate School Of Engineering Tohoku University

• Seko Masahito

  Optical Measurement Technology Development Co. Ltd.

• Higuchi M

  Kyushu Univ. Fukuoka

• Higuchi Masahiko

  Optical Measurement Technology Development Co. Ltd.

• SEKO Masahito

  Optical Measurement Technology Development Co., Ltd.

• IWAOKA Hideto

  Optical Measurement Technology Development Co., Ltd.

• SEKO Mashahito

  Optical Measurement Technology Development Co., Ltd.

• Iwaoka Hideto

  Optical Measurement Technology Development Co. Ltd.

• HIGUCHI Masahiko

  Optical Measurement Technology Development Co., Ltd.

• WADA Morio

  Optical Measurement Technology Development Co., Ltd.

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著作論文

• High-Speed GaInAs PIN Photodiodes with Low Series Resistance
• Evaluation of Surface Zn Concentration in Zn Diffusion into InP
• Effects of Phosphorus Pressure on Low-Energy Emission Bands in Zn-Diffused InP
• Wide-Wavelength GaInAs PIN Photodiodes Using a Lattice-Mismatched Light-Absorbing Layer and a Thin InP Cap Layer
• Incorporation of Arsenic and Gallium in InP Layers in GaInAs/InP Heterostructures Grown by MOVPE
• GaInAs/InP PIN Photodiodes Fabricated by MOVPE and a New Zn Diffusion Technique
• Zn Diffusion into InP Using Dimethylzinc as a Zn Source

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