Sohn Jung-min | Semicodutor R&d Center Samsung Electronics

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概要

• 同名の論文著者
• Semicodutor R&d Center Samsung Electronicsの論文著者

関連著者

• Sohn Jung-min

  Semicodutor R&d Center Samsung Electronics

• Choi Seong-woon

  Semicodutor R&d Center Samsung Electronics

• Cho Sung-yong

  Semicodutor R&d Center Samsung Electronics

• Ahn Byoung-sup

  Semiconductor R&d Center Samsung Electronics Co. Ltd.

• CHOI Ji-Hyeon

  Semicodutor R&D Center, Samsung Electronics

• KIM Byung-Gook

  Semicodutor R&D Center, Samsung Electronics

• JEON Chan-Uk

  Semicodutor R&D Center, Samsung Electronics

• CHOI Seong-Woon

  Semicodutor R&D Center, Samsung Electronics

• SOHN Jung-Min

  Semicodutor R&D Center, Samsung Electronics

• Jeon Chan-uk

  Semicodutor R&d Center Samsung Electronics

• Park Joon-soo

  Semiconductor R&d Center Samsung Electronics Co. Ltd.

• Choi Ji-hyeon

  Semicodutor R&d Center Samsung Electronics

• Kim Byung-gook

  Semicodutor R&d Center Samsung Electronics

• Choi Seong-Woon

  Semiconductor R&D Center, Samsung Electronics Co., Ltd., San No24, Nongseo, Giheung, Yongin, 449-711, South Korea

• Ahn Byoung-sup

  Semiconductor R&D Center, Samsung Electronics Co., Ltd., San No24, Nongseo, Giheung, Yongin, 449-711, South Korea

• Sohn Jung-Min

  Semiconductor R&D Center, Samsung Electronics Co., Ltd., San No24, Nongseo, Giheung, Yongin, 449-711, South Korea

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著作論文

• A Study of Loading Effect during Electron-Beam Exposure and Etching Process in Photomask Fabrication
• Monte Carlo Simulation Study of Local Critical Dimension Error on Mask and Wafer

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