Par Youngsoo | Microelectronics Laboratory, Samsung Advanced Institute of Technology
スポンサーリンク
概要
関連著者
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Lee J
Samsung Advanced Inst. Technol. Suwon Kor
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Lee June
Microelectronics Laboratory Materials And Device Sector Samsung Advanced Institute Of Technology
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CHUNG Ilsub
Microelectronics Laboratory, Materials and Device Sector, Samsung Advanced Institute of Technology
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Par Youngsoo
Microelectronics Laboratory, Samsung Advanced Institute of Technology
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Park Youngsoo
Process Engineering Lab Samsung Advanced Institute Of Technology
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Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Park Youngsoo
Microelectronics Laboratory Materials And Device Sector Samsung Advanced Institute Of Technology
著作論文
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti)O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor
- Hydrogen-Induced Degradation of Oxygen Plasma Treated Ferroelectric Pb (Zr,Ti) O_3 Capacitor