PENG Shing-Kan | Department of Electronic Engineering, Chang Gung University
スポンサーリンク
概要
関連著者
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Wang Jer-chyi
Nanya Technology Corporation Hwa-ya Technology Park
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Lai Chao-sung
Department Of Electronic Engineering Chang Gung University
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PENG Shing-Kan
Department of Electronic Engineering, Chang Gung University
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WONG Jian-Yi
Department of Electronic Engineering, Chang Gung University
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Peng Shing-kan
Department Of Electronic Engineering Chang Gung University
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LAI Chao-Sung
Department of Electronic Engineering, Chang Gung University
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Fan Kung-ming
Department Of Electronic Engineering Chang Gung University
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PAN Tung-Ming
Department of Electronic Engineering, Chang Gung University
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YANG Shih-Cheng
Department of Electronic Engineering, Chang Gung University
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Yang Shih-cheng
Department Of Electrical Engineering National Central University Jungli
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Yang Shih-cheng
Department Of Electronic Engineering Chang Gung University
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Pan Tung-ming
Department Of Electronic Engineering Chang Gung University
著作論文
- Work Function Adjustment by Nitrogen Incorporation in HfN Gate Electrode
- Nitrogen Induced Extrinsic States (NIES) in Effective Work Function Instability of TiN_x/SiO_2 and TiN_x/HfO_2 Gate Stacks