Yoon Jong-won | Dep. Of Advanced Materials Sci. And Engineering Dankook Univ.
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概要
関連著者
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YOON Jong-Won
Department of Advanced Materials Science and Engineering, Dankook University
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Yoon Jong-won
Department Of Advanced Materials Science And Engineering Dankook University
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Yoon Jong-won
Dep. Of Advanced Materials Sci. And Engineering Dankook Univ.
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CHOI Chel-Jong
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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Choi Chel-jong
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Choi Chel-jong
School Of Semiconductor And Chemical Engineering Semiconductor Physics Res. Center (sprc) Chonbuk Na
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Chandra S.
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Yoon Jong-won
Department Of Advanced Materials Engineering Dong-eui University
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KANG Seung-Min
Department of Advanced Materials Science and Engineering, Hanseo University
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HONG Hyo-Bong
Future Technology Research Group, Electronics and Telecommunications Research Institute (ETRI)
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LEE Soo-Hyung
Future Technology Research Group, Electronics and Telecommunications Research Institute (ETRI)
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KIM Jin-Gyu
Division of Electron Microscopic Research, Korea Basic Science Institute (KBSI)
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AHN Kwang-Soon
School of Display and Chemical Engineering, Yeungnam University
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Ahn Kwang-soon
School Of Display And Chemical Engineering Yeungnam University
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CHANDRA S.
School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chon
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Choi Chel-jong
Department Of Bin Fusion Technology Chonbuk National University
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Lee Hoon-ki
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Kim Jin-gyu
Division Of Electron Microscopic Research Korea Basic Science Institute (kbsi)
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Shim Kyu-hwan
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Lee Soo-hyung
Future Technology Research Group Electronics And Telecommunications Research Institute (etri)
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Hong Hyo-bong
Future Technology Research Group Electronics And Telecommunications Research Institute (etri)
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Kang Seung-min
Department Of Advanced Materials Science And Engineering Hanseo University
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Park Yun-chang
Measurement And Analysis Division National Nanofab Center (nnfc)
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Jeong Myung-il
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Chandra S.
School Of Semiconductor And Chemical Engineering Semiconductor Physics Research Center (sprc) Chonbu
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Shim Kyu-hwan
Chonbuk National University
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Chandra S.
Chonbuk National University
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Choi Chel-jong
Chonbuk National University
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LEE Hoon-Ki
Chonbuk National University
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YOON Jong-Won
Dankook University
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Kang Seung-Min
Department of Advanced Materials Engineering, Kyonggi University, Suwon, Gyeonggi-do 443-760, Republic of Korea
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Ahn Kwang-Soon
School of Chemical Engineering, Yeungnam University, Gyeongsan, Gyeongbuk 712-749, Korea
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AHN Kwang-soon
School of Chemical Engineering, Yeungnam University
著作論文
- In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO_2 Films
- Effect of Annealing Ambient on Structural and Electrical Properties of Ge Metal-Oxide-Semiconductor Capacitors with Pt Gate Electrode and HfO_2 Gate Dielectric
- Electrical and Structural Properties of Metal-Oxide-Semiconductor (MOS) Devices with Pt/Ta_2O_5 Gate Stacks