Fukuyama Hiroyuki | Ntt Lsi Laboratories
スポンサーリンク
概要
関連著者
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Fukuyama Hiroyuki
Ntt Lsi Laboratories
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WAHO Takao
NTT LSI Laboratories
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Fukuyama Hiroyuki
Department Of Chemistry And Materials Science Tokyo Institute Of Technology
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Fukuyama H
Ntt System Electrics Lab. Kanagawa Jpn
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Mizutani Takashi
Ntt Lsi Laboratories
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FUKUYAMA Hiroyuki
Graduate School of Science and Engineering, Tokyo Institute of Technology
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Fukuyama H
Tokyo Inst. Technol. Tokyo Jpn
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Waho T
Ntt System Electronics Lab. Kanagawa Jpn
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Waho T
Sophia Univ. Tokyo Jpn
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Waho T
Department Of Electrical And Electronics Engineering Sophia University
著作論文
- Excess Current through Single-Barrier Structures with Si-planar-doped AlAs Layer
- Effects of Impurities in GaAs/AlAs Double-Barrier Structures on Resonant Transmission Coefficients
- Effects of Impurity Scattering on Resonant Transmission Coefficients in GaAs/AlAs Double-Barrier Structures