Nagasawa Koichi | Lsi R & D Lab. Mitsubishi Electric Co.
スポンサーリンク
概要
関連著者
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Nagasawa Koichi
Lsi R & D Lab. Mitsubishi Electric Co.
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MATSUMOTO Heihachi
Mitsubishi Electric Corporation
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Sawada Kokichi
Mitsubishi Electric Co. Kitaitami Works
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Hirayama Makoto
Lsi R & D Lab. Mitsubishi Electric Co.
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Matsumoto Heihachi
Mitsubishi Electric Co. Kitaitami Works
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Asai Sotoju
Lsi R & D Lab. Mitsubishi Electric Co.
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HIRAYAMA Makoto
Mitsubishi Electric Corporation, ULSI Laboratory
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ASAI Sotoju
LSI R & D Lab. Mitsubishi Electric Co.
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ASAI Sotoju
Mitsubishi Electric Corporation
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NAGASAWA Koichi
Mitsubishi Electric Corporation
著作論文
- Time Dependent Dielectric Breakdown of Thin SiO_2 Films
- The Effect of Gate Bias on Hot Electron Trapping