Oh Moon-su | Technology Research Center Agency For Defense Development
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概要
関連著者
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Oh Moon-su
Technology Research Center Agency For Defense Development
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JO Min-Sik
Technology Research Center, Agency for Defense Development
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Jo M‐s
Agency For Defense Dev. Taejon Kor
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Jo Min-sik
Technology Research Center Agency For Defense Development
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Jo Min-Sik
Technology Research Center, Agency for Defense Development, Yusong P. O. Box 35-5, Taejon 305-600, Korea
著作論文
- Data Averaging Effect on Roughness Measurement using Phase-Shifting Interferometry for a Few-Ten-Angstrom and Sub-Angstrom Rough Surfaces
- Data Averaging Effect on Roughness Measurement using Phase-Shifting Interferometry for a Few-Ten-Angstrom and Sub-Angstrom Rough Surfaces