HAYASAKA Kazuhiro | National Institute of Information and Communications Technology
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概要
- Hayasaka Kazuhiroの詳細を見る
- 同名の論文著者
- National Institute of Information and Communications Technologyの論文著者
関連著者
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Li Ying
National Institute Of Information And Communications Technology
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MATSUBARA Kensuke
National Institute of Information and Communications Technology
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HAYASAKA Kazuhiro
National Institute of Information and Communications Technology
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HOSOKAWA Mizuhiko
National Institute of Information and Communications Technology
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ITO Hiroyuki
National Institute of Information and Communications Technology
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KAJITA Masatoshi
National Institute of Information and Communications Technology
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Li Y
National Nano Device Labs.
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Matsubara Kensuke
National Institute of Advanced Industrial Science and Technology (AIST)
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UETAKE Satoshi
National Institute of Information and Communications Technology
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NAGANO Shigeo
National Institute of Information and Communications Technology
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Hosokawa M
Tohoku Univ. Sendai Jpn
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Nagano Shigeo
National Inst. Information And Communications Technol. Tokyo Jpn
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Li Ying
National Institute of Information and Communications Technology, Koganei, Tokyo184-8795, Japan
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Li Ying
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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Uetake Satoshi
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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Matsubara Kensuke
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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Hosokawa Mizuhiko
National Institute of Information and Communications Technology, Koganei, Tokyo184-8795, Japan
著作論文
- Frequency Measurement of the Optical Clock Transition of ^Ca^+ Ions with an Uncertainty of 10^ Level
- Precise Frequency-Drift Measurement of Extended-Cavity Diode Laser Stabilized with Scanning Transfer Cavity
- Preparing Single Ions in m=0 States in the Lamb-Dicke Regime
- Preparing Single Ions in $m=0$ States in the Lamb-Dicke Regime
- Precise Frequency-Drift Measurement of Extended-Cavity Diode Laser Stabilized with Scanning Transfer Cavity