Precise Frequency-Drift Measurement of Extended-Cavity Diode Laser Stabilized with Scanning Transfer Cavity
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概要
- 論文の詳細を見る
A simple and effective method for stabilizing laser frequencies using scanning transfer cavities and a stabilized helium–neon laser was applied to extended-cavity diode lasers near 866 nm and 397 nm. The frequency drift of the stabilized 866 nm laser measured using an optical frequency synthesizer was smaller than 200 kHz for 1 h. The square root of the Allan variance was $1\times 10^{-10}$ at an averaging time of $10^{3}$ s.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2005-01-15
著者
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Li Ying
National Institute Of Information And Communications Technology
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MATSUBARA Kensuke
National Institute of Information and Communications Technology
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HAYASAKA Kazuhiro
National Institute of Information and Communications Technology
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ITO Hiroyuki
National Institute of Information and Communications Technology
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HOSOKAWA Mizuhiko
National Institute of Information and Communications Technology
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UETAKE Satoshi
National Institute of Information and Communications Technology
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Li Ying
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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Uetake Satoshi
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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Matsubara Kensuke
National Institute of Advanced Industrial Science and Technology (AIST)
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Matsubara Kensuke
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-7432, Japan
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