Kawamura Naoki | Ntt Lsi Laboratories
スポンサーリンク
概要
関連著者
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Kawamura Naoki
Ntt Lsi Laboratories
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Sakai Tomoaki
Ntt Lsi Laboratories
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Oshima Masaharu
Ntt Applied Electronics Laboratories
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Kawamura N
Nhk Sci. & Technical Res. Lab. Tokyo Jpn
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Yabumoto Norikuni
Ntt Lsi Laboratories
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SUGAHARA Hirohiko
NTT Applied Electronics Laboratories
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MINEGISHI Kazushige
NTT LSI Laboratories
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Sugahara H
Univ. Tsukuba Ibaraki Jpn
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Minegishi K
Yamanashi Univ. Kofu Jpn
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Shimaya Masakazu
Ntt Lsi Laboratories
著作論文
- Photoemission Study on Initial Oxidation of Si Surfaces by Super-Pure Oxygen Gas
- An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnections (Special Issue on LSI Failure Analysis)