Nakagawa Gou | Center For Microelectronic Systems Kyushu Institute Of Technology

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概要

• NAKAGAWA Gouの詳細を見る
• 同名の論文著者
• Center For Microelectronic Systems Kyushu Institute Of Technologyの論文著者

関連著者

• Asano Tanemasa

  Center For Microelectronic Systems Kyushu Institute Of Technology

• Nakagawa Gou

  Center For Microelectronic Systems Kyushu Institute Of Technology

• Maeda Y

  Deparment Of Information And Control Engineering Toyota Technological Institute

• ARIMA Yutaka

  Center for Microelectronic Systems, Kyushu Institute of Technology

• Maeda Y

  Center For Microelectronic Systems Kyushu Institute Of Technology

• Arima Yutaka

  Department Of Neural Amp Parallel Processing Technology Advanced Technology Rampd Center Mitsubishi

• Arima Yutaka

  Center For Microelectronic System Kyushu Institute Of Technology

• MAEDA Yasuhiro

  Center for Microelectronic Systems, Kyushu Institute of Technology

• Maeda Yukio

  Department Of Applied Physics Tokyo University Of Agriculture And Technology

• Miyasaka Mitsutoshi

  Advanced Product Development Center, Seiko Epson Corporation, 281 Fujimi, Suwa, Nagano 399-0293, Japan

• SHIBATA Noritoshi

  Center for Microelectronic Systems, Kyushu Institute of Technology

• Asano Tanemasa

  Kyushu Univ. Fukuoka Jpn

• Miyasaka Mitsutoshi

  Advanced Product Development Department

• Shibata Noritoshi

  Center For Microelectronic Systems Kyushu Institute Of Technology

• Stoemenos John

  Department of Physics, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece

• Higashi Naoyuki

  Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, Fukuoka 820-8502, Japan

• Nakagawa Gou

  Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan

• Nakagawa Gou

  Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, Fukuoka 820-8502, Japan

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著作論文

• Effects of Electric Field on Metal-Induced Lateral Crystallization under Limited Ni-Supply Condition(Thin Film Transistors, Fundamental and Application of Advanced Semiconductor Devices)
• Physical Random-Number Generator Using Schottky MOSFET
• Physical Random-Number Generator Using Schottky MOSFET
• Location and Orientation Control of Si Grain by Combining Metal-Induced Lateral Crystallization and Excimer Laser Annealing
• Location Control of Si Thin-Film Grain Using Ni Imprint and Excimer Laser Annealing

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