Kang Dae-gwan | R&d Division Hyundai Microelectronics Co.
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概要
R&d Division Hyundai Microelectronics Co. | 論文
- Impact of Nitrogen Implantation in Lightly Doped Drain(NIL)on Deep Sub-Micron CMOS Devices
- The Impact of Nitrogen Implantation at LDD(NIL) on Deep Sub-Micron CMOS Devices
- Integrated Twin-Guide Corner Reflector Lasers with Surface-Grating-Etching for Simple Mode Selectivity
- Electrical Characteristics of Ultra Short Channel CMOS Device for Giga-bit DRAM Applications
- Effect of Channeling of Halo Ion Implantation on Threshold Voltage Instability of MOSFET's