Kruger A | Univ. Iowa Usa
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概要
Univ. Iowa Usa | 論文
- A Method of Static Test Compaction Based on Don't Care Identification (特集:システムLSIの設計技術と設計自動化)
- On Detection of Bridge Defects with Stuck-at Tests
- Don't Care Identification and Statistical Encoding for Test Data Compression(Test Generation and Compaction)(Test and Verification of VLSI)
- Groove Pancreatitis : A Case Report
- Comparison of washout rate between planar image : 1-BMIPP study