Leong M‐s | National Univ. Singapore Sgp
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概要
National Univ. Singapore Sgp | 論文
- Reliability of Thin Gate Oxides Irradiated under X-Ray Lithography Conditions
- Gate Oxide Reliability Concern Associated with X-Ray Lithography
- Investigation of Reliability Degradation of Ultra-Thin Gate Oxides Irradiated under Electron-Beam Lithography Conditions
- Intergrity of Gate Oxides Irradiated Under Electron-Beam Lithography Conditions
- Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)