JOHAN Erni | Graduate School of Science and Engineering, Ehime University

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• Graduate School of Science and Engineering, Ehime Universityの論文著者

Graduate School of Science and Engineering, Ehime University | 論文

• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Addressing Defect Coverage through Generating Test Vectors for Transistor Defects
• Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors
• Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools
• Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment

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