Fu Cheng | School of Electrical and Electronic Engineering Nanyang Technological University
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School of Electrical and Electronic Engineering Nanyang Technological University | 論文
- Depth Profiling of Si Oxidation States in Si-Implanted SiO_2 Films by X-Ray Photoelectron Spectroscopy
- Post-Breakdown Conduction Instability of Ultrathin SiO_2 Films Observed in Ramped-Current and Ramped-Voltage Current-Voltage Measurements
- Influence of $k\cdot p$ Formalisms on the Band Structure of InxGa1-xAs1-yNy/GaAs Quantum Well: A Comparison of 8-Band and 10-Band Models
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology