Kwon Jong-Kee | Electronics and Telecommunications Research Institute
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概要
Electronics and Telecommunications Research Institute | 論文
- Temperature Dependent Breakdown Characteristics in InP/InGaAs Avalanche Photodiodes
- Rate Compatible Block Turbo Codes for Hybrid ARQ Schemes(Fundamental Theories)
- Etching Behavior and Damage Recovery of SrBi_2Ta_2O_9 Thin Films
- The Etching Behaviors of Pt/SrBi_2Ta_2O_9/NO/Si Structure for MFIS in NDRO-Type FRAM
- The Etching Behaviors of Pt/SrBi_2Ta_2O_9/NO/Si Structure for MFIS in NDRO-Type FRAM