Nihei Yoshimasa | Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo
スポンサーリンク
概要
- Nihei Yoshimasaの詳細を見る
- 同名の論文著者
- Department of Industrial Chemistry, Faculty of Engineering, University of Tokyoの論文著者
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo | 論文
- Structural and Chemical State Analysis of the Heat-Treated Au/GaSb(110) Interface by Means of Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS)
- Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
- Chemical State Analysis of Silicon-Oxygen Compounds : CHEMICAL APPLICATIONS
- Data Processing in High Resolution X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Measurements of Plasma Parameters in a High-Frequency Glow Discharge Using the Orifice Probe