CHEN H. | Institute of Mechatronics Engineering, National Taipei University of Technology
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Institute of Mechatronics Engineering, National Taipei University of Technology | 論文
- The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
- The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
- DC Hot Carrier Reliability at Elevated Temperatures for nMOSFETs Using 0.13μm Technology
- Mismatches under the Impact of Hot Carrier Stress in 0.15μm Technology
- In Silico Analysis of Crustacean Hyperglycemic Hormone Family