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Institute of Mechatronics Engineering, National Taipei University of Technology | 論文

• DC Hot Carrier Reliability at Elevated Temperatures for nMOSFETs Using 0.13μm Technology
• The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
• The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
• Mismatches under the Impact of Hot Carrier Stress in 0.15μm Technology
• In Silico Analysis of Crustacean Hyperglycemic Hormone Family

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