Zhang Lin-Tao | Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China

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• 同名の論文著者
• Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. Chinaの論文著者

Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China | 論文

• Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors
• Simultaneous 3-D Imaging Using Chirped Ultrashort Optical Pulses
• Characteristics of Band-to-Band Tunneling Hot Hole Injection for Erasing Operation in Charge-Trapping Memory

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