スポンサーリンク
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China | 論文
- Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors
- Simultaneous 3-D Imaging Using Chirped Ultrashort Optical Pulses
- Characteristics of Band-to-Band Tunneling Hot Hole Injection for Erasing Operation in Charge-Trapping Memory