LIN Shy-Chaung | AHEAD Optoelectronics, Inc.
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概要
AHEAD Optoelectronics, Inc. | 論文
- 特集解説 Interferometric Metrology of Dynamic Properties of MEMS (特集 マイクロマシンにおける計測技術)
- A High Performance Doppler Interferometer for Advanced Optical Storage Systems
- Signal Processing Algorithms for Doppler Effect Based Nanometer Positioning Systems