Goto Takashi | Microelectronics Research Center, Sanyo Electric Co., Ltd., 2–1 Koyadai, Tsukuba–shi, Ibaraki 305, Japan
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概要
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- 同名の論文著者
- Microelectronics Research Center, Sanyo Electric Co., Ltd., 2–1 Koyadai, Tsukuba–shi, Ibaraki 305, Japanの論文著者
論文 | ランダム
- Radon Migration Process and Its Influence Factors; Review
- ^Rn Exhalation Rate from Egyptian Building Materials Using Active and Passive Methods
- A Naturally Ventilated Accumulator for Integrating Measurements of Radon Flux from Soil
- Epidemiological Potentials of Radon- and Thoron-Prone Area in China
- 138 Dose due to thoron and its decay products in Chinese loess plateau(Effects of radiation exposures, Abstracts of the 46th Annual Meeting of the Japan Radiation Research Society)