Nishida Masahiro | Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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概要
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University | 論文
- Improved Stability of Metal-Insulator-Diamond Semiconductor Interface by Employing BaF_2 Insulator Film
- Deep-Level Transient Spectroscopy of Interface States in ZnO/PrCoO_x/ZnO Thin-Film Junctions
- Electrical Properties of Al/CaF_2/i-Diamond Metal-Insulator-Semiconductor Field-Effect-Transistor Fabricated by Ultrahigh Vacuum Process
- X-Ray Photoelectron Spectroscopy Characterization of Diamond Thin Film Surfaces for Electronic Device Application
- Electrical Properties of Al/(Ba_XCa_)F_2/i-Diamond Metal-Insulator-Semiconductor Structures