Aoki Yukio | Department of Electrical and Electric Engineering, Kanagawa Institute of Technology
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概要
- AOKI Yasushiの詳細を見る
- 同名の論文著者
- Department of Electrical and Electric Engineering, Kanagawa Institute of Technologyの論文著者
Department of Electrical and Electric Engineering, Kanagawa Institute of Technology | 論文
- X-Ray Analysis of Stress Distribution in Semiconductor Films Bonded to a Piezoelectric Substrate(Instrumentation, Measurement, and Fabrication Technology)
- Grown-in Microdefects in a Slowly Grown Czochralski Silicon Crystal Observed by Synchrotron Radiation Topography
- Mierodefects in an As-Grown Czoehralski Silicon Crystal Studied by Synchrotron Radiation Section Topography with Aid of Computer Simulation
- Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography