Shibata Masahiro | Analytical Characterization Center, Sumitomo Electric Industries, Ltd.
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- Analytical Characterization Center, Sumitomo Electric Industries, Ltd.の論文著者
Analytical Characterization Center, Sumitomo Electric Industries, Ltd. | 論文
- Epitaxially Grown Diamond (001) 2×1/1×2 Surface Investigated by Scanning Tunneling Microscopy in Air
- Facet Passivation of GaInAsP/InP Edge-Emitting Laser Diode by Aluminum Ultrathin Layer Insertion
- Electrostatic-Discharge-Induced Degradation Caused by Argon Ion Bombardment in Facet-Coating Process of GaInAsP/InP Laser Diode
- Relationship between Reverse-Biased Electrostatic-Discharge Tolerance and Aging of GaInAsP/InP Buried-Heterostructure Laser Diodes
- Failure Analysis of InP-Based Edge-Emitting Buried Heterostructure Laser Diodes Degraded by Forward-Biased Electrostatic Discharge Tests