Liu Li-Tian | Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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- Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. Chinaの論文著者
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China | 論文
- Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors
- Simultaneous 3-D Imaging Using Chirped Ultrashort Optical Pulses
- Characteristics of Band-to-Band Tunneling Hot Hole Injection for Erasing Operation in Charge-Trapping Memory