YEH Wen-Kuan | 論文著者

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Labora

Department Of Electronics Engineering National Chiao Tung University And National Nano Device Laboratory

Department of Electronics Engineering, National Chiao Tung University and National Nano Device Laboratory

Department of Electronics Engineering, National Chiao Tung University and National Nano Device Laboratory,

Electrical Engineering Department National University Of Kaohsiung

Electrical Engineering Department, National University of Kaohsiung

Electrical Engineering Department, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu Dist., Kaohsiung 811, Taiwan

Electrical Engineering Department, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu Dist., Kaohsiung, Taiwan

Institute of Materials Science and Engineering, National Chiao Tung University

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D

United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D