CHUNG Ilsub | 論文著者

Material & Device Lab Samsung Advanced Institute Of Technology

Materials And Devices Lab Samsung Advanced Institute Of Technology

Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology

Microelectronics and Device Laboratory, Samsung Advanced Institute of Technology

Microelectronics Laboratory Materials And Device Sector Samsung Advanced Institute Of Technology

Microelectronics Laboratory, Materials and Device Sector, Samsung Advanced Institute of Technology

Microelectronics Laboratory, Materials and Device Sector, Samsung Advanced Institute of Technology, P.O. Box 111, Suwon 440–600, Korea

School of Info rolation and Communications Engineering, Sun gKyunKwan University

School of inforinarion and Communications Engineering, SungKyunKwan University

School Of Information & Communications Engineering Sungkyunkwan University

School of Information & Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Kyunggi-do 440-746, Korea

School Of Information And Communication Engineering Sungkyunkwan University

School of Information and Communication Engineering, Sungkyunkwan University

School of Information and Communication Engineering, Sungkyunkwan University, Gyeonggi-Do 440-746, Korea

School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea

School Of Information And Communications Engineering Sungkyunkwan University

School of Information and Communications Engineering, SungKyunKwan University

School of Information and Communications Engineering, SungKyunKwan University, 300 Chunchun-dong, Jangan-gu, Suwon-city, Kyungi-do, Korea

School of Information and Communications Engineering, SungKyunKwan University, 300, Chunchun-Dong, Jangan-Ku, Suwon 440-746, Korea

Seiko Instruments Inc.