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表面分析研究会 | 論文
- オージェ電子分光による化学状態分析の現状
- SIにつながる真の電子スペクトルを求める実験法(1)
- SIにつながる真の電子スペクトルを求める実験法(2)
- SIにつながる真の電子スペクトルを求める実験法(3)
- 講義 透過型電子顕微鏡による合金化溶融亜鉛めっき鋼板の微細構造解析
- The MRI-Model in Sputter Depth Profiling: Capabilities, Limitations and Recent Progress (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- Secondary ion mass spectrometry using size-selected gas cluster ion beam (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Development and Applications of Multiple Delta-Layer Reference Materials for Semiconductor Analysis
- Ion beam sputtering for high resolution depth profiling (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Damage distribution in Si surface by 0.5keV Ar〔+〕 ion bombardment
- 原子間力顕微鏡を用いた遷移金属酸化物におけるメモリ効果の機構解明 (表面分析研究会 第36回研究会 講演資料)
- SIMS Depth Profiling of Characteristic Thin Surface Layers Formed in Titanium by Mechanical Abrasion and Annealing
- Diagnosis and cleaning of carbon contamination on SiO2 thin film (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- An improved backscattering correction equation for wide analytical conditions on quantitative Auger analysis (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Auger depth profiling analysis using an inclined holder (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- New Developments in Data for Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- A predictive formula for the electron stopping power (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- The backscattering factor for systems with non-uniform in-depth profile (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Simulation and Quantitative Interpretation of Electron Spectra for Surface Analysis Surface Excitation Correction for Elastic Peak Electron Spectroscopy(EPES)
- Determination of surface-excitation parameters for elastic peak electron spectroscopy (EPES) using the database of Goto (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)